nanovoxel 2000 series breached the constraints of traditional optical microscope, sem and tem. with world-leading spatial resolution and contrast, this system can analysis the inner micro-structure of sample. the original structure can be retained by using this equipment and the detector system can satisfy different requirements of spatial resolution. the scanned 3d data can provide high resolution 3d/4d solutions.
dual optical paths can provide users for the flexible solutions of cross-scale sample test and large cabient can allow in situ experiment appliance to be integrated in this system.
compact structure and small occupied area.
simple operation mode of this system is easy for users to handle.
